DocumentCode
3528971
Title
Charge relaxation and gain depletion for candidate secondary electron emission materials
Author
Insepov, Zeke ; Ivanov, Valentin ; Elam, Jeffrey ; Adams, Bernhard ; Frisch, H.
Author_Institution
Argonne Nat. Lab., Argonne, IL, USA
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
1193
Lastpage
1198
Abstract
Microchannel plates (MCPs) are widely used in photodetectors with a picosecond resolution. Two main characteristics of MCPs, gain and timing resolution, strongly depend on the materials parameters, as well as on the history of electron avalanche evolution. The most important effect that can significantly change the efficiency of an MCP is the effect of saturation of the electronic current, which occurs at high-level input signals. In this paper, the saturation effects are studied numerically, as they are applicable to analysis of large-area, fast photodetectors. It is shown that the saturation effect for short pulses can be reduced by introducing a thin, resistive layer between the bulk material and the emissive coating. The gain and time resolution dependencies on the pore size and voltage are studied numerically. The results are compared with the simulations of other authors and available experimental data.
Keywords
electron avalanches; microchannel plates; photodetectors; secondary electron emission; charge relaxation; electron avalanche evolution; electronic current saturation; gain depletion; microchannel plate; photodetector; secondary electron emission material; timing resolution; Aluminum oxide; Conductivity; Electric fields; Films; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5873957
Filename
5873957
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