• DocumentCode
    3528971
  • Title

    Charge relaxation and gain depletion for candidate secondary electron emission materials

  • Author

    Insepov, Zeke ; Ivanov, Valentin ; Elam, Jeffrey ; Adams, Bernhard ; Frisch, H.

  • Author_Institution
    Argonne Nat. Lab., Argonne, IL, USA
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    1193
  • Lastpage
    1198
  • Abstract
    Microchannel plates (MCPs) are widely used in photodetectors with a picosecond resolution. Two main characteristics of MCPs, gain and timing resolution, strongly depend on the materials parameters, as well as on the history of electron avalanche evolution. The most important effect that can significantly change the efficiency of an MCP is the effect of saturation of the electronic current, which occurs at high-level input signals. In this paper, the saturation effects are studied numerically, as they are applicable to analysis of large-area, fast photodetectors. It is shown that the saturation effect for short pulses can be reduced by introducing a thin, resistive layer between the bulk material and the emissive coating. The gain and time resolution dependencies on the pore size and voltage are studied numerically. The results are compared with the simulations of other authors and available experimental data.
  • Keywords
    electron avalanches; microchannel plates; photodetectors; secondary electron emission; charge relaxation; electron avalanche evolution; electronic current saturation; gain depletion; microchannel plate; photodetector; secondary electron emission material; timing resolution; Aluminum oxide; Conductivity; Electric fields; Films; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5873957
  • Filename
    5873957