• DocumentCode
    3529617
  • Title

    Characterization of an FPGA-based DAQ system in the KATRIN experiment

  • Author

    Phillips, David G., II ; Bergmann, Till ; Corona, Thomas J. ; Fränkle, Florian ; Howe, Mark A. ; Kleifges, Matthias ; Kopmann, Andreas ; Leber, Michelle ; Menshikov, Alexander ; Tcherniakhovski, Denis ; VanDevender, B. ; Wall, Brandon ; Wilkerson, John F.

  • Author_Institution
    Dept. of Phys. & Astron., Univ. of North Carolina, Chapel Hill, NC, USA
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    1399
  • Lastpage
    1403
  • Abstract
    This article will describe the procedures used to validate and characterize the combined hardware and software DAQ system of the KATRIN experiment. The Mk4 DAQ Electronics is the latest version in a series of field programmable gate array (FPGA)-based electronics developed at the Karlsruhe Institute of Technology´s Institute of Data Processing and Electronics (IPE). This system will serve as the primary detector readout in the KATRIN experiment. The KATRIN data acquisition software is a MacOS X application called ORCA (Object-oriented Real-time Control and Acquisition), which includes a powerful scripting language called ORCAScript. This article will also describe how ORCAScript is used in the validation and characterization tests of the Mk4 DAQ electronics system.
  • Keywords
    data acquisition; field programmable gate arrays; nuclear electronics; nuclear engineering computing; readout electronics; FPGA-based DAQ system; KATRIN experiment; MacOS X application; Mk4 DAQ Electronics; ORCA software; ORCAScript; data acquisition software; field programmable gate array; hardware DAQ system; primary detector readout; software DAQ system; Data acquisition; Detectors; Field programmable gate arrays; Hardware; Linearity; Physics; Software; Data acquisition; FPGA electronics; neutrinos; scripting; software;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5874002
  • Filename
    5874002