Title :
Measurements and performance of a low noise 64-channel ASIC with CdTe strip detectors
Author :
Kachel, Maciej ; Grybos, Pawel ; Szczygiel, Robert ; Taguchi, Takeyoshi
Author_Institution :
Dept. of Meas. & Instrum., Univ. of Sci. & Technol. - AGH, Krakow, Poland
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
We present the design and measurement results of an ASIC aimed to work with both AC and DC coupled detectors, in a single photon counting mode with an energy window. The ASIC can work with input leakage currents in the range from -10 nA up to 7 nA. The ENC obtained with an AC-coupled Si detector is 120 e- for a peaking time Tp = 115 ns and Cdet = 1.2 pF. With a DC-coupled CdTe detector, the ENC is 160 e- rms for a peaking time Tp = 380 ns and Cdet = 2 pF and the leakage current Idleak = 0.15 nA. The implemented trim DACs at the discriminator inputs allows to minimize the effective threshold spread to 8 e- rms (at one sigma level). We also present the updated version of the ASIC that can operate with X-ray energies up to 100 keV and has an improved high count rate performance. For the new ASIC the preliminary measurements with the CdTe detector are presented.
Keywords :
application specific integrated circuits; cadmium compounds; leakage currents; photon counting; semiconductor counters; AC-coupled Si detector; CdTe strip detectors; DC-coupled CdTe detector; X-ray energies; input leakage currents; low noise 64-channel ASIC; single photon counting mode; Application specific integrated circuits; Current measurement; Detectors; Electron tubes; Leakage current; Noise; Silicon;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5874038