DocumentCode
3530801
Title
Electromagnetic modeling of SPP resonance for low noise RF magnitude modulation of optical carriers
Author
Tripon-Canseliet, C. ; Faci, S. ; Stolz, A. ; Dogheche, E. ; Decoster, D. ; Loiseaux, B. ; Delboulbe, A. ; Huignard, J.P. ; Chazelas, J.
Author_Institution
Electron. & Electromagn. Lab., UPMC Univ Paris 06, Paris, France
fYear
2010
fDate
5-9 Oct. 2010
Firstpage
135
Lastpage
138
Abstract
In this paper, light modulation efficiency using surface plasmon polariton (SPP) excitation in metal/electro-optic material interface is investigated by electromagnetic simulations. The propagation constant of the plasmon wave are controlled by an electric field applied across the electro-optic layer and thus modulates in magnitude the reflected light.
Keywords
electro-optical modulation; light propagation; light reflection; optical noise; polaritons; surface plasmon resonance; SPP resonance; electromagnetic modeling; light modulation efficiency; light reflection; low noise RF magnitude modulation; metal-electro-optic material interface; optical carriers; plasmon wave; propagation constant; surface plasmon polariton excitation; Modulation; Optical films; Optical reflection; Optical surface waves; Reflectivity; Refractive index;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Photonics (MWP), 2010 IEEE Topical Meeting on
Conference_Location
Montreal, QC
Print_ISBN
978-1-4244-7824-8
Type
conf
DOI
10.1109/MWP.2010.5664194
Filename
5664194
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