Nonlinear Mismatch Modeling of resistor device for circuit simulations

Mismatch effects are vital in manufacturing variability for both active and passive devices especially in analog circuit designs. This paper presents a new method to characterize the nonlinear mismatch effects for resistor device using a compact SPICE resistor model. The proposed model is simple in methodology with fewer model coefficients but provides an accurate prediction of nonlinear mismatch characteristics which are mostly found in submicron semiconductor process and below. The model accuracy is experimentally verified by the good agreements between measured and Monte Carlo simulated data where the root mean square error is less than 5%. The model is applied into circuit design example to show the model suitability for yield prediction purpose.