DocumentCode
3532832
Title
High-Speed Multi-Channel Multi-Threshold Level Sampling Test: Detected 1GHz Digital Signal by Agilent 16903A Logic Analyzer
Author
Tang, Kai ; Meng, Qiao ; Liu, Hai-tao
Author_Institution
Inst. of RF- & OE-ICs (IROI), Southeast Univ. (SEU), Nanjing
fYear
2009
fDate
28-29 April 2009
Firstpage
1
Lastpage
4
Abstract
The highest sampling rate of Agilent 16903A logic analyzer is 4 GHz and the maximum input channel bandwidth is 250 MHz. We can not accurately judge the logic levels of more than 250 MHz input signal because of the input channel bandwidth limitation, and thus we can not collect the right data at a higher rate of input signal. The issue had been deeply studied. In order to access a higher speed output data, we used a multi-channel multi-threshold level method to collect data, and then got the correct output result after processing it. We successfully developed this approach in high-speed ADC measurement. It breaks the bandwidth limitation, greatly enhances the performance of the instrument and is proved to be a feasible and effective testing program.
Keywords
logic analysers; signal detection; signal sampling; Agilent 16903A logic analyzer; bandwidth 250 MHz; data collection; digital signal detection; frequency 1 GHz; frequency 4 GHz; high-speed ADC measurement; high-speed multi-channel multi-threshold level sampling test; input channel bandwidth limitation; Bandwidth; Capacitance; Circuit testing; Clocks; Frequency synchronization; Logic testing; Sampling methods; Signal analysis; Signal detection; Signal sampling;
fLanguage
English
Publisher
ieee
Conference_Titel
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-2587-7
Type
conf
DOI
10.1109/CAS-ICTD.2009.4960830
Filename
4960830
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