DocumentCode
3532891
Title
Monitoring energy calibration drift using the scintillator background radiation
Author
Conti, Maurizio ; Eriksson, Lars ; Hayden, Charles
Author_Institution
Mol. Imaging, Siemens Healthcare, Knoxville, TN, USA
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
2515
Lastpage
2522
Abstract
Scintillating materials commonly used in nuclear medicine can contain traces of isotopes that naturally emit gamma or beta radiation. Examples of these are 138La contained in LaBr3 and other Lanthanum based scintillators, and 176Lu contained in LSO, LYSO, LuYAP and other Lutetium based scintillators. In particular, 176Lu decays into 176Hf and emits a beta particle with maximum energy 589 keV, and a cascade of gamma rays of energies 307 keV, 202 keV and 88 keV. We propose to use the background radiation for monitoring of detector calibration drift and for self-calibration of detectors in complex detector systems. A calibration drift due to random or systematic changes in PMT gain was studied in a Siemens PET scanner, based on LSO blocks. Both a conventional radioactive source (68Ge, 511 keV photons from electron-position annihilation) and the LSO background radiation were used for calibration. The difference in the calibration peak shift at 511 keV estimated with the two methods was less than 10%.
Keywords
amplification; calibration; germanium; lutetium compounds; photomultipliers; positron emission tomography; radioactive tracers; solid scintillation detectors; 68Ge; LuSiO5; PMT gain; Siemens PET scanner; beta radiation; electron volt energy 511 keV; electron-position annihilation; energy calibration drift; gamma radiation; isotope traces; nuclear medicine; radioactive source; scintillator background radiation; self-calibration; Calibration; Crystals; Detectors; Energy measurement; Photonics; Position measurement; Positron emission tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5874240
Filename
5874240
Link To Document