DocumentCode :
3533097
Title :
Degradation of power semiconductor modules for trains
Author :
Fukuda, Toshio
Author_Institution :
Railway Tech. Res. Inst., Kokubunji, Japan
fYear :
2013
fDate :
2-6 Sept. 2013
Firstpage :
1
Lastpage :
8
Abstract :
Various electronic equipment including traction converters is installed in railway vehicles. It is important to improve the reliability of each element constituting the equipment. To obtain the data required for the maintenance and renewal work of traction converters mounted on recent EMUs, we developed a new method to estimate the degradation of power semiconductor modules, which are one of the parts of the converters. In this paper, the results of thermal resistance measurements are reported and degradation estimation for high-voltage / high-current IGBT modules is discussed.
Keywords :
electric resistance measurement; insulated gate bipolar transistors; maintenance engineering; power apparatus; power convertors; power field effect transistors; railway electrification; semiconductor device reliability; thermal resistance measurement; traction; EMU; electronic equipment; high-voltage-high-current IGBT module; maintenance; power semiconductor module; railway vehicle; reliability; thermal resistance measurement; traction converter; train; Degradation; Electrical resistance measurement; Insulated gate bipolar transistors; Semiconductor device measurement; Temperature measurement; Thermal resistance; Device characterisation; IGBT; Maintenance; Rail vehicle; Semiconductor device;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Applications (EPE), 2013 15th European Conference on
Conference_Location :
Lille
Type :
conf
DOI :
10.1109/EPE.2013.6631757
Filename :
6631757
Link To Document :
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