• DocumentCode
    3533468
  • Title

    Determination of Second-Order Nonlinearities of Thin Films of Low Symmetry

  • Author

    Kauranen, Martti ; Van Elshocht, S. ; Verbiest, Thierry ; Persoons, A. ; Nuckolls, C. ; Katz, T.J.

  • Author_Institution
    University of Leuven
  • fYear
    1998
  • fDate
    14-18 Sept. 1998
  • Firstpage
    54
  • Lastpage
    54
  • Keywords
    Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Europe, 1998. 1998 CLEO/Europe. Conference on
  • Conference_Location
    Glasgow, Scotland
  • Print_ISBN
    0-7803-4233X
  • Type

    conf

  • DOI
    10.1109/CLEOE.1998.718958
  • Filename
    718958
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3533468