Title :
Sol gel dip coated Indium oxide films
Author :
Ramanathan, G. ; Xavier, John ; Murali, K.R.
Author_Institution :
Dept. of Phys., Sri Sairam Eng. Coll., Chennai, India
Abstract :
In2O3 thin films were deposited by the sol gel dip coating method using the Acrylamide route. Basic characterizations were done using XRD, XPS, AFM and EDAX and confirm the stoichiometric In2O3 with cubic structure. AFM confirms the increase in surface roughness in the film with indium doping.
Keywords :
X-ray chemical analysis; X-ray diffraction; X-ray photoelectron spectra; atomic force microscopy; dip coating; doping; indium compounds; sol-gel processing; stoichiometry; surface roughness; thin films; AFM; EDAX; In2O3; X-ray diffraction; X-ray photoelectron spectroscopy; XPS; XRD; acrylamide route; atomic force microscopy; cubic structure; energy dispersive X-ray analysis; indium doping; indium oxide thin films; sol-gel dip coating; stoichiometry; surface roughness; Annealing; Educational institutions; X-ray scattering; Acrylamide route; In2O3; Sol gel;
Conference_Titel :
Nanoscience, Engineering and Technology (ICONSET), 2011 International Conference on
Conference_Location :
Chennai
Print_ISBN :
978-1-4673-0071-1
DOI :
10.1109/ICONSET.2011.6167907
