Title :
Cost trade-offs of various design for test techniques
Author :
Druckerman, Howard B. ; Kusko, Mary P. ; Pateras, Stephen ; Shephard, Philip G., III
Abstract :
Test cost is becoming a major factor in today´s complex chip designs. One approach to lower test cost is to have the product test, or help test, itself. There are a wide variety of Design-for-Test techniques that have been developed for this purpose. A number of these techniques are evaluated against various related cost issues
Keywords :
Built-in self-test; Circuit testing; Clocks; Costs; Design for testability; Hardware; Latches; Logic testing; Shift registers; System testing;
Conference_Titel :
Economics of Design, Test, and Manufacturing, 1994. Proceedings., Third International Conference on the
Conference_Location :
Austin, TX, USA
Print_ISBN :
0-8186-6595-5
DOI :
10.1109/ICEDTM.1994.496091
