DocumentCode
3535159
Title
Monolithic integrated resonant tunneling diode and heterostructure junction field effect transistor logic circuits
Author
Yen, J.C. ; Zhang, Q. ; Mondry, M.J. ; Chavarkar, P.M. ; Hu, E.L. ; Long, S.I. ; Mishra, U.K.
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fYear
1995
fDate
19-21 June 1995
Firstpage
58
Lastpage
59
Abstract
The use of resonant tunneling diodes in combination with three-terminal gain devices, such as HBTs or FETs, has been successfully realized, and these RTD+HBT and RTD+FET circuits exhibit strong potential for achieving higher integrated circuit densities and speed by exploiting the unique properties of RTDs. Heterostructure junction FETs (HJFETs) have comparable high performance to other heterostructure transistors with greater threshold reproducibility than conventional Schottky-gate heterostructure FETs and are simpler to manufacture than HBTs. We have developed a technology for fabricating monolithically integrated heterostructure junction field effect transistors (HJFETs) and resonant tunneling diodes (RTDs) from a single MBE sequence. Using this technology, we have constructed asynchronous logic and multivalued logic building block circuits.
Keywords
asynchronous circuits; field effect logic circuits; integrated circuit measurement; molecular beam epitaxial growth; multivalued logic circuits; resonant tunnelling diodes; semiconductor growth; semiconductor heterojunctions; MBE growth sequence; asynchronous logic; heterostructure junction field effect transistor; integrated circuit densities; logic circuits; monolithically integrated systems; multivalued logic; resonant tunneling diode; three-terminal gain devices; threshold reproducibility; FETs; HEMTs; High speed integrated circuits; Integrated circuit technology; JFETs; Multivalued logic; RLC circuits; Reproducibility of results; Resonant tunneling devices; Schottky diodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 1995. Digest. 1995 53rd Annual
Conference_Location
Charlottesville, VA, USA
Print_ISBN
0-7803-2788-8
Type
conf
DOI
10.1109/DRC.1995.496270
Filename
496270
Link To Document