Title :
Spin injection from the Heusler alloy Co2MnGe into Al0.1Ga0.9As/GaAs heterostructures
Author :
Dong, X.Y. ; Lou, X. ; Adelmann, C. ; Strand, J. ; Petford-Long, A.K. ; Crowell, P.A. ; Palmstrom, C.J.
Author_Institution :
Dept. of Chem. Eng. & Mater. Sci., Minnesota Univ., Minneapolis, MN, USA
Abstract :
Co2MnGe epitaxial films were grown by molecular beam epitaxy (MBE) on Al0.1Ga0.9As [001] surfaces prepared in a separate MBE-growth chamber and transferred in ultra high vacuum (<10-10 torr) to the Heusler alloy MBE growth chamber. In-situ RHEED, ex-situ XRD and TEM demonstrate single crystal epitaxial growth of the films. In-plane VSM measurements showed that the Co2MnGe films have saturation magnetization of 1000 emu/cm3 at room temperature and a coercivity of 8 Oe. A SQUID magnetometer was used to measure the out of plane magnetization, which was found to saturate around 0.8 Tesla. We found that Co2MnGe formed Schottky contact on n-Al0.1Ga0.9As with 0.82 eV barrier height with ideality factor of 1.03. In order to measure the spin injection, tunneling Schottky barrier contact spin-LED structures were fabricated from MBE-grown Al/Co2MnGe/n+/n- Al0.1Ga0.9As/ i - Al0.1Ga0.9As / i-GaAs (100 Å) / i-Al0.1Ga0.9As/p-Al0.1Ga0.9As heterostructures. The 70 Å thick Co2MnGe Schottky barrier injector was grown at 175°C and the 25 Å thick Al capping layer used to prevent oxidation during exposure to air was grown at 0°C. The epitaxial heterostructures were processed into LED devices and the devices were operated with the Schottky contact under reverse bias and the p-i-n LED under forward bias. Electroluminescence was collected along the sample normal. The circular polarization of the observed electroluminescence was 14% indicating a spin injection of 14% at 2 K. The injected spin polarization at 2 K was calculated to be 27% based on a calibration of the spin detector using Hanle effect measurements.
Keywords :
Hanle effect; Schottky barriers; Schottky diodes; X-ray diffraction; aluminium compounds; cobalt alloys; coercive force; electroluminescence; gallium arsenide; germanium alloys; light emitting diodes; magnetic tunnelling; magnetisation; manganese alloys; metallic epitaxial layers; molecular beam epitaxial growth; polarisation; reflection high energy electron diffraction; semiconductor heterojunctions; semiconductor-metal boundaries; spin polarised transport; transmission electron microscopy; 0 degC; 100 angstrom; 175 degC; 2 K; 25 angstrom; 293 to 298 K; 70 angstrom; Al capping layer; Al0.1Ga0.9As/GaAs heterostructures; Co2MnGe epitaxial films; Co2MnGe-Al0.1Ga0.9As-GaAs; Hanle effect measurements; Heusler alloy; LED devices; MBE; RHEED; SQUID magnetometer; Schottky barrier injector; Schottky contact; TEM; VSM measurements; XRD; barrier height; circular polarization; coercivity; electroluminescence; epitaxial heterostructures; forward bias; ideality factor; molecular beam epitaxy; out of plane magnetization; oxidation; reverse bias; single crystal epitaxial growth; spin detector; spin injection; tunneling Schottky barrier contact spin-LED structures; Aluminum alloys; Cobalt alloys; Electroluminescence; Gallium alloys; Light emitting diodes; Molecular beam epitaxial growth; Polarization; Schottky barriers; Spin polarized transport; X-ray scattering;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1464027