Title :
Energy selective X-ray imaging with Medipix
Author :
Procz, S. ; Lübke, J. ; Zwerger, A. ; Fauler, A. ; Pichotka, M. ; Mix, M. ; Fiederle, M.
Author_Institution :
Freiburger Materialforschungszentrum (FMF), Freiburg, Germany
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
Pixelated photon counting semiconductor X-ray detectors like the Medipix feature adjustable energy thresholds allowing selective counting of photons of a specified energy. This enables energy selective X-ray imaging with advanced material information. Furthermore the photon counting function principle of these detectors enables almost noiseless X-ray imaging providing a high contrast in low contrast objects. The aim of this study is to analyze the stability of the new Medipix3 detector especially in relation to flatfield correction for X-ray imaging applications and to present its use for high resolution low contrast X-ray imaging, and for energy selective X-ray imaging as well.
Keywords :
diagnostic radiography; photon counting; photons; Medipix3 detector; advanced material information; energy selective X-ray imaging; energy thresholds; flatfield correction; high resolution low contrast X-ray imaging; low contrast objects; noiseless X-ray imaging; pixelated photon counting semiconductor X-ray detectors; Detectors; Photonics; Pixel; Semiconductor device measurement; Signal to noise ratio; Time measurement; X-ray imaging;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5874533