Session IV GaN lifetests

fYear

2008

fDate

12-12 Oct. 2008

Firstpage

171

Lastpage

171

Abstract

Start of the above-titled section of the conference proceedings record.

Keywords

Electron Devices Society; Gallium arsenide; Gallium nitride; Reliability engineering;

fLanguage

English

Publisher

ieee

Conference_Titel

ROCS Workshop, 2008 [Reliability of Compound Semiconductors Workshop]

Conference_Location

Monterey, CA, USA

Print_ISBN

0-7908-0120-5

Type

conf

DOI

10.1109/ROCS.2008.4686655

Filename

4686655

Link To Document