Tilted magnetization in Cr/CoCrPt thin film recording media

Author

Ajan, Anlony ; Inomata, A. ; Yamagishi, W.

Author_Institution

Fujitsu Labs. Ltd., Atsugi, Japan

fYear

2005

fDate

4-8 April 2005

Firstpage

1593

Lastpage

1594

Abstract

The epitaxial growth of Cr/CoCrPt thin film recording media using sputter deposition was studied in this paper. Its structural properties were investigated by X-ray diffraction (XRD) and high-resolution transmission electron microscopy (HRTEM) to analyze the crystallographic texture and granularity of the films, respectively. SQUID and Kerr magnetometers were used to measure the magnetisation of the film. Also, read/write properties of the film were also studied.

Keywords

X-ray diffraction; chromium; chromium alloys; cobalt alloys; magnetic epitaxial layers; magnetic recording; magnetisation; platinum alloys; sputter deposition; transmission electron microscopy; Cr-CoCrPt; HRTEM; Kerr magnetometer; SQUID magnetometer; X-ray diffraction; XRD; crystallographic texture; epitaxial growth; granularity; high-resolution transmission electron microscopy; read/write properties; sputter deposition; structural properties; thin film recording media; tilted magnetization; Chromium; Crystallography; Epitaxial growth; Magnetic analysis; Magnetization; Sputtering; Transistors; Transmission electron microscopy; X-ray diffraction; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International

Print_ISBN

0-7803-9009-1

Type

conf

DOI

10.1109/INTMAG.2005.1464230

Filename

1464230