Title :
Tracking closely maneuvering targets in clutter with an IMM-JVC algorithm
Author :
Jouan, A. ; Jarry, B. ; Michalska, H.
Author_Institution :
R&D Dept., Lockheed Martin Canada, Montreal, Que., Canada
Abstract :
The tracking of closely maneuvering targets represents a challenge for both the contact-to-track association and the positional estimation algorithms. Previous simulations have shown that the coupling of an association scheme using the Joncker-Volgenant-Castanon (JVC) optimization with an Interacting Multiple Model (IMM) positional estimator gives superior tracking performance than other tested combinations such as the JVC-Adaptive Kalman Filter (JVC-AKF), the Nearest Neighbour (NN)-AKF (NN-AXF) or the NN-IMM. However, the efficiency of the JVC optimization scheme will depend on how the assignment matrix is built. This highlights the role played by both the construction of the buffers of contacts and the selection of the tracks likely to be updated with the incoming contacts. After a brief recall of the IMM-JVC formalism, this paper presents an analysis of the JVC output and identifies additional functionalities which should be activated to improve its performance. Simulation results are obtained on a scenario which involves two closely maneuvering aircraft. Sensor reports are contaminated with simulated random clutter.
Keywords :
adaptive Kalman filters; digital simulation; optimisation; radar clutter; sensor fusion; target tracking; IMM-JVC algorithm; JVC-Adaptive Kalman Filter; Joncker-Volgenant-Castanon optimization; closely maneuvering targets tracking; contact-to-track association; interacting multiple model; positional estimation algorithms; positional estimator; simulated random clutter; simulations; Computational modeling; Contacts; Detectors; Recursive estimation; Research and development; Sensor fusion; Sensor phenomena and characterization; State estimation; Target tracking; Testing;
Conference_Titel :
Information Fusion, 2000. FUSION 2000. Proceedings of the Third International Conference on
Conference_Location :
Paris, France
Print_ISBN :
2-7257-0000-0
DOI :
10.1109/IFIC.2000.862558