• DocumentCode
    3539770
  • Title

    Ordering process and size effect of FePt magnetic thin films

  • Author

    Takahashi, Y.K. ; Hono, K.

  • Author_Institution
    Nat. Inst. for Mater. Sci., Tsukuba, Japan
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    1921
  • Lastpage
    1922
  • Abstract
    This study focuses on the relationship between the microstructure and the magnetic properties of in-situ ordered L10-FePt thin films. Results from selected area electron diffraction (SAED) and transmission electron microscopy (TEM) analyses show that the ordering in the thin films progresses by the abnormal grain growth of disordered nano-grains. The driving force of the abnormal grain growth is the grain boundary and strain energies that are accumulated in the films with the film thickness. When the particle size is smaller than 3.5 nm, the ordering does not progress even after prolonged annealing time at 600°C. The degree of order increases to 1 as the particle size increases and the critical size of the ordering is found to be about 4 nm. This critical size of ordering depends on the interfacial energy and it is also smaller than the superparamagnetic limit of the L10 ordered FePt particles.
  • Keywords
    annealing; electron diffraction; ferromagnetic materials; grain boundaries; grain growth; iron alloys; magnetic particles; magnetic thin films; particle size; platinum alloys; superparamagnetism; transmission electron microscopy; 600 degC; FePt; abnormal grain growth; annealing; disordered nanograins; grain boundary; in-situ ordered thin films; interfacial energy; microstructure; ordering critical size; particle size; selected area electron diffraction; size effect; strain energies; superparamagnetic limit; transmission electron microscopy; Annealing; Capacitive sensors; Diffraction; Grain boundaries; Magnetic analysis; Magnetic films; Magnetic properties; Microstructure; Transistors; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1464395
  • Filename
    1464395