DocumentCode :
3539996
Title :
High density magnetic random access memory using a pair of asymmetrical cell
Author :
Lim, C.K. ; Kim, Y.S. ; Park, N.Y. ; Lee, J.
Author_Institution :
Samsung Adv. Inst. of Technol., Suwon, South Korea
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
1975
Lastpage :
1976
Abstract :
Magnetic random access memory (MRAM) is one of the most promising candidates to provide energy efficient and non-volatile memory. We present a new MRAM design using a pair of asymmetrical cells. The pair cells have parallelogram shaped to induce broken shape magnetic anisotropy along the short axis of the cell. One important advantage of the pair cells is that they can share the same Word and Bit lines intersection in the MRAM architecture. This means that the number of electrical current lines can be reduced and leading to higher recording density. The new concept is successfully demonstrated using finite element micromagnetic simulation.
Keywords :
finite element analysis; magnetic anisotropy; magnetic recording; magnetic storage; micromagnetics; random-access storage; MRAM; asymmetrical cell; finite element micromagnetic simulation; high density magnetic random access memory; magnetic anisotropy; nonvolatile memory; recording density; Anisotropic magnetoresistance; Finite element methods; Magnetic anisotropy; Magnetic fields; Magnetic separation; Magnetostatics; Perpendicular magnetic anisotropy; Random access memory; Saturation magnetization; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1464426
Filename :
1464426
Link To Document :
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