• DocumentCode
    3540002
  • Title

    Paired interaction effect on switching behaviors of patterned "Pac-man" array

  • Author

    Han, H. ; Hong, Y.K. ; Park, M.H. ; Choi, B.C. ; Gee, S.H. ; Jabal, J. ; Abo, G. ; Lyle, A. ; Wong, B. ; Donohoe, Gregory W.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Idaho Univ., Moscow, ID, USA
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    1977
  • Lastpage
    1978
  • Abstract
    Recently, "Pac-man" (PM) shaped magnetic elements have shown superior switching properties over the rectangular and elliptical structures and even better switching behaviors were observed in elongated PM (EPM) elements. In this study, the magnetic interaction between EPM pairs was investigated by varying spacing and changing pair configuration ("face-to-face" and "back-to-back" pair configuration) to increase memory density of MRAM or patterned recording media. Magneto-optical Kerr effect (MOKE) and magnetic force microscopy were used to characterize the magnetic properties of the magnetic elements. Results show that "back-to-back" pair configuration shows weaker magnetostatic interactions than the "face-to-face" pair configuration. A "back-to-back" patterned configuration is more favorable for high density memory applications.
  • Keywords
    Kerr magneto-optical effect; magnetic force microscopy; magnetic hysteresis; magnetic recording; magnetic storage; magnetic switching; MOKE; MRAM; back-to-back pair configuration; face-to-face pair configuration; magnetic force microscopy; magnetic interaction; magneto-optical Kerr effect; memory density; paired interaction effect; patterned Pac-man array; patterned recording media; switching; Atomic force microscopy; Magnetic anisotropy; Magnetic domains; Magnetic force microscopy; Magnetic properties; Magnetic separation; Magnetic switching; Magnetostatics; Perpendicular magnetic anisotropy; Sputtering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1464427
  • Filename
    1464427