DocumentCode
3540137
Title
Non-invasive vectorial electric field characterization with optical probes
Author
Gaborit, Gwenael ; Lecoche, Frederic ; Dahdah, Jean ; Duraz, Eric ; Duvillaret, Lionel ; Lasserre, Jean-Louis
Author_Institution
IMEP-LAHC, Univ. de Savoie, Le Bourget-du-Lac, France
fYear
2013
fDate
9-13 Sept. 2013
Firstpage
1016
Lastpage
1019
Abstract
This paper describes electric field sensors based on electro-optic technique. The principle is explained and the effect is optimized within a pigtailed electro-optic probe. The performances are fully evaluated, in terms of linearity, dynamics, vectorial selectivity, bandwidth and disturbance on the field to be measured. Some examples of application such as mapping of E-field in guided configuration are demonstrated.
Keywords
electric field measurement; electro-optical devices; bandwidth; disturbance; dynamics; electric field sensors; electro-optic technique; field measurement; guided configuration; linearity; noninvasive vectorial electric field characterization; optical probes; pigtailed electro-optic probe; vectorial selectivity; Bandwidth; Crystals; Laser beams; Measurement by laser beam; Optical sensors; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on
Conference_Location
Torino
Print_ISBN
978-1-4673-5705-0
Type
conf
DOI
10.1109/ICEAA.2013.6632395
Filename
6632395
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