Title :
Thickness and annealing temperature dependence of perpendicular exchange biasing in [Pd/Co]/FeMn multilayers
Author :
Joo, H.W. ; Kim, S.W. ; Lee, M.S. ; An, J.H. ; Choi, S.D. ; Lee, K.A. ; Lee, S.S. ; Hwang, D.G.
Author_Institution :
Dept. of Phys., Dankook Univ., Cheonan, South Korea
Abstract :
The thickness of Pd, Co, FeMn, and buffer (Ta, Pd) layers and annealing temperature dependences on perpendicular exchange biasing field (Hex) and coercivity field (Hc) in Ta(Pd)/[Pd/Co]n/FeMn/Ta(Pd) multilayers are investigated. Hysteresis loops with perpendicular magnetization curves were measured using extraordinary Hall effect. Increase in the thickness of buffer Ta layer lead to the enhancement of both Hex and Hc. The Hex of 0.1 nm Pd sample increased slightly from 125 Oe to 145 Oe, and vanished at 0.5 nm Pd. As the Co thickness decreases, the Hex and Hc increased up to 360 Oe and 633 Oe in 0.48 nm and 0.32 nm Co sample, respectively. Hex increased up to 130 Oe as the FeMn thickness increases to 12 nm, and decreased to 90 Oe at 21 nm FeMn thickness. Hex is also observed to increase as the annealing temperature increases. At 330 °C, the perpendicular anisotropy disappeared.
Keywords :
Hall effect; annealing; cobalt; coercive force; ferromagnetic materials; iron alloys; magnetic hysteresis; magnetic multilayers; manganese alloys; palladium; perpendicular magnetic anisotropy; tantalum; 0.1 nm; 0.32 nm; 0.48 nm; 0.5 nm; 12 nm; 21 nm; 330 degC; Pd-[Pd-Co]n-FeMn-Pd; Ta-[Pd-Co]n-FeMn-Ta; annealing temperature; coercivity field; extraordinary Hall effect; hysteresis loops; multilayers; perpendicular anisotropy; perpendicular exchange biasing; perpendicular magnetization; thickness; Anisotropic magnetoresistance; Annealing; Coercive force; Hall effect; Hysteresis; Magnetic field measurement; Magnetic multilayers; Magnetization; Nonhomogeneous media; Temperature dependence;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1464463