• DocumentCode
    3540535
  • Title

    Physical properties of Ni2MnGe alloy films with different atomic orders

  • Author

    Kim, R.J. ; Lee, N.N. ; Kim, B.J. ; Lee, Y.P. ; Kudryavtsev, Y.V. ; Kim, K.W.

  • Author_Institution
    Quantum Photonic Sci. Res. Center, Hanyang Univ., Seoul, South Korea
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    2117
  • Lastpage
    2118
  • Abstract
    Ni2MnGe films with significantly different structural orders were fabricated, and the influence of atomic ordering on various physical properties has been investigated. The structural characterization was performed by X-ray diffraction (XRD). The temperature dependence of magnetization was investigated with a superconducting quantum interference device. The optical properties were obtained using a spectroscopic ellipsometer, and the magneto-optical properties were understood by measuring the equatorial Kerr effect (EKE). Infrared and ultraviolet spectra of the films were also studied. It was found that the structural disorder in Ni2MnGe film causes lack of the ferromagnetic order and noticeable changes in the energy band structure.
  • Keywords
    Kerr magneto-optical effect; X-ray diffraction; ellipsometry; ferromagnetic materials; germanium alloys; infrared spectra; magnetic thin films; magnetisation; manganese alloys; metallic thin films; nickel alloys; ultraviolet spectra; Ni2MnGe; X-ray diffraction; XRD; alloy films; atomic orders; energy band structure; equatorial Kerr effect; ferromagnetic order; infrared spectra; magnetization; magneto-optical properties; spectroscopic ellipsometer; structural disorder; superconducting quantum interference device; ultraviolet spectra; Atomic measurements; Magnetic properties; Magnetization; Optical diffraction; Optical films; Superconducting films; Superconducting photodetectors; Temperature dependence; X-ray diffraction; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1464497
  • Filename
    1464497