DocumentCode
3540992
Title
Using multi-scale density for local feature-based registration in SAR imagery
Author
Zhang, Hui ; Zhao, Baojun
Author_Institution
Sch. of Inf. & Electron., Beijing Inst. of Technol. Beijing, Beijing, China
fYear
2009
fDate
16-19 Aug. 2009
Abstract
We present a registration algorithm for automatic, robust SAR (Synthetic Aperture Radar) image alignment. The registration problem is handled using sparse feature representation, which comprises local feature localization and description. The feature location is determined by detecting bifurcation structure in edge image and its orientation is assigned using corresponding bifurcation structure type. Then, the local structure is characterized by distinctive non-parametric cross-scale descriptor derived from image patches which extracted in every level of multi-scale pyramid and centered at relevant bifurcation structure. We adopt an elaborate feature mismatches identification strategy to perform Generalized Hough Transform and robust RANSAC fitting in sequence. Accordingly, a group of more accurate warp parameters can be derived even when outliers are predominant in primary feature match set. This approach provides robust matching across a substantial rang of distortion and is less sensitive to speckle noise as well as lack of stable details in SAR imagery. In experimental results, we demonstrated the effectiveness of this approach for natural SAR images.
Keywords
Hough transforms; filtering theory; image matching; image registration; radar imaging; synthetic aperture radar; Hough transform; RANSAC fitting; bifurcation structure; image alignment; image matching; image registration; local feature localization; multiscale density; radar imaging; sparse feature representation; synthetic aperture radar; Backscatter; Bifurcation; Image edge detection; Image registration; Noise robustness; Radar imaging; Radar polarimetry; Speckle; Synthetic aperture radar; Vehicle detection; SAR imagery; image matching; local feature; multi-scale density; registration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-3863-1
Electronic_ISBN
978-1-4244-3864-8
Type
conf
DOI
10.1109/ICEMI.2009.5274071
Filename
5274071
Link To Document