A novel nonlinear statistical modeling technique for microwave devices

Author

Swidzinski, J.F. ; Chang, K.

Author_Institution

Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA

Volume

2

fYear

2000

fDate

11-16 June 2000

Firstpage

887

Abstract

A novel nonlinear methodology for representing statistical variations of FET Equivalent Circuit Parameters (ECPs) and a new approach to yield estimation are presented. Proposed statistical nonlinear characterization is based on combination of applied multivariate methods with heuristic techniques, while proposed yield estimation method is based on Latin Hypercube Sampling (LHS). Practical examples validate the accuracy and efficiency of the methods.

Keywords

circuit optimisation; equivalent circuits; field effect MMIC; integrated circuit modelling; integrated circuit yield; microwave field effect transistors; semiconductor device models; statistical analysis; FET; Latin hypercube sampling; equivalent circuit parameters; heuristic techniques; microwave devices; multivariate methods; nonlinear statistical modeling technique; statistical variations; yield estimation; Eigenvalues and eigenfunctions; Hypercubes; Microwave FETs; Microwave devices; Microwave theory and techniques; Principal component analysis; Sampling methods; Scattering parameters; USA Councils; Yield estimation;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest. 2000 IEEE MTT-S International

Conference_Location

Boston, MA, USA

ISSN

0149-645X

Print_ISBN

0-7803-5687-X

Type

conf

DOI

10.1109/MWSYM.2000.863322

Filename

863322