DocumentCode :
3541929
Title :
A novel correlated double sampling poly-Si circuit for readout systems in large area X-ray sensors
Author :
Rankov, A. ; Rodriguez-Villegas, E. ; Lee, M.J.
Author_Institution :
Fac. of Electr. & Electron. Eng., Imperial Coll., London, UK
fYear :
2005
fDate :
23-26 May 2005
Firstpage :
728
Abstract :
A novel poly-Si correlated double sampling circuit, which can be used as a noise and offset cancellation block in large area X-ray sensor readout electronics is presented. The circuit is simple, robust to threshold voltage variations and its topology provides high speed and low power consumption.
Keywords :
biomedical equipment; correlation methods; diagnostic radiography; elemental semiconductors; high-speed integrated circuits; integrated circuit design; integrated circuit noise; interference suppression; low-power electronics; readout electronics; signal sampling; silicon; Si; circuit speed; circuit topology; correlated double sampling poly-Si circuit; large area X-ray sensors; noise and offset cancellation block; power consumption; readout electronics; readout systems; threshold voltage variations; Active matrix technology; Circuit noise; Glass; Image sensors; Noise cancellation; Readout electronics; Sampling methods; Sensor systems; Thin film transistors; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN :
0-7803-8834-8
Type :
conf
DOI :
10.1109/ISCAS.2005.1464691
Filename :
1464691
Link To Document :
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