Title :
Microwave breakdown in output multiplexer filters
Author :
Boussavie, C. ; Baillargeat, D. ; Aubourg, M. ; Verdeyme, S. ; Guillon, P. ; Catherinot, A. ; Vigneron, S. ; Theron, B.
Author_Institution :
IRCOM, Limoges Univ., France
Abstract :
A theoretical investigation is made of microwave breakdown in output multiplexer filters. The effects of the electrical breakdown cause irreversible damage to the device and so the power level, which generates such a phenomenon, must be predicted. This study needs a pluridisciplinary approach with a combination of three fields of the science: the electromagnetism, the thermic and the plasma physics.
Keywords :
cavity resonator filters; electric breakdown; finite element analysis; microwave filters; space vehicle electronics; electrical breakdown; microwave breakdown; output multiplexer filters; pluridisciplinary approach; power level; Electric breakdown; Electric variables measurement; Electromagnetic measurements; Fasteners; Frequency; Microwave filters; Multiplexing; Plasma applications; Plasma devices; Plasma temperature;
Conference_Titel :
Microwave Symposium Digest. 2000 IEEE MTT-S International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-5687-X
DOI :
10.1109/MWSYM.2000.863570