• DocumentCode
    3544084
  • Title

    Performance comparison of III-V MOSFETs with source filter for electron energy

  • Author

    Kai-Tak Lam ; Yee-Chia Yeo ; Gengchiau Liang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
  • fYear
    2012
  • fDate
    10-13 Dec. 2012
  • Abstract
    We evaluated the performances of two high-energy-electrons filtering MOSFET designs, the superlattice source-extension (SL) MOSFET and the p+/n+ source-junction (p+n+ source) MOSFET, using the sp3d5s* full-band tight-binding model, coupled with a non-equilibrium Green´s function quantum transport simulator in the ballistic regime. III-V semicoductor heterojunctions made up of GaAs and In53Ga47As are investigated and the optimizing parameters such as the length of the barrier and well regions for the SL-MOSFETs and the doping concentrations and the length of n+ region for the p+n+ source MOSFETs are varied to understand their effects on the device performance parameters. More detailed interactions between electrons are considered in the present full-band simulations. Our optimized SL-MOSFET and p+n+ source MOSFET achieve ION = 0.81 and 0.60 mA/μm, SS = 20.9 and 23.1mV/dec@VDS=0.6V, respectively.
  • Keywords
    Green´s function methods; III-V semiconductors; MOSFET; filters; gallium arsenide; indium compounds; p-n junctions; tight-binding calculations; III-V MOSFET; III-V semicoductor heterojunctions; In53Ga47As; SL MOSFET; device performance parameters; electron energy; full-band simulations; high-energy-electrons filtering MOSFET designs; nonequilibrium Green´s function quantum transport simulator; p+-n+ source-junction; p+n+ source MOSFET; source filter; sp3d5s* full-band tight-binding model; superlattice source-extension MOSFET design; voltage 0.6 V; Doping; Filtering; Gallium arsenide; MOSFETs; Performance evaluation; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2012 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0163-1918
  • Print_ISBN
    978-1-4673-4872-0
  • Electronic_ISBN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.2012.6479062
  • Filename
    6479062