DocumentCode
3544314
Title
[Front cover]
fYear
2012
fDate
10-11 July 2012
Abstract
The following topics are dealt with: interconnect design; memory circuits; analog circuits; physical design modeling; nanoelectronics; sensors; signal integrity; advanced packaging; digital VLSI test; and high speed interfaces.
Keywords
VLSI; analogue circuits; electronics packaging; integrated circuit design; integrated circuit testing; interconnections; nanoelectronics; sensors; storage management chips; advanced packaging; analog circuits; digital VLSI test; high speed interfaces; interconnect design; memory circuits; nanoelectronics; physical design modeling; sensors; signal integrity;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ASQED), 2012 4th Asia Symposium on
Conference_Location
Penang
Print_ISBN
978-1-4673-2687-2
Type
conf
DOI
10.1109/ACQED.2012.6320458
Filename
6320458
Link To Document