Title :
Process technology implications for FPGAs (Invited Paper)
Author :
Lewis, David ; Chromczak, J.
Author_Institution :
Altera Corp, Toronto, ON, Canada
Abstract :
This paper presents aspects of process technology applicable to FPGAs. Overdrive of transistors for routing pass gates is an important performance and reliability factor. Random variation effects are significant for small arrays of configuration RAM, but small impact on performance. We discuss challenges for CRAM and switch replacement using novel technologies.
Keywords :
field programmable gate arrays; network routing; random-access storage; reliability; CRAM; FPGA; process technology; random variation effect; reliability factor; routing pass gates; switch replacement; transistor; Delay; Field programmable gate arrays; Logic gates; Reliability; Routing; Table lookup; Wires;
Conference_Titel :
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-4872-0
Electronic_ISBN :
0163-1918
DOI :
10.1109/IEDM.2012.6479100
