• DocumentCode
    3544440
  • Title

    Uniform methodology for benchmarking beyond-CMOS logic devices

  • Author

    Nikonov, Dmitri E. ; Young, Ian A.

  • Author_Institution
    Components Res., Intel Corp., Hillsboro, OR, USA
  • fYear
    2012
  • fDate
    10-13 Dec. 2012
  • Abstract
    A consistent methodology for benchmarking beyond CMOS logic devices was developed to guide the research directions. The promising devices - tunneling FET and spin wave devices - perform > 1015 Integer Ops/s/cm2 with power <; 1W/cm2.
  • Keywords
    CMOS logic circuits; field effect transistors; spin waves; tunnelling; benchmarking; beyond-CMOS logic devices; spin wave devices; tunneling FET; uniform methodology; Adders; CMOS integrated circuits; Delay; Logic gates; Magnetoelectronics; Switches; Torque;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2012 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0163-1918
  • Print_ISBN
    978-1-4673-4872-0
  • Electronic_ISBN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.2012.6479102
  • Filename
    6479102
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3544440