• DocumentCode
    3545695
  • Title

    An efficient and well-controlled IC system development flow: design approved specification and design guided test plan

  • Author

    Zhou, Tracey ; Tarim, Tuna B.

  • Author_Institution
    Wireless Analog Technol. Center, Texas Instruments, Dallas, TX, USA
  • fYear
    2005
  • fDate
    23-26 May 2005
  • Firstpage
    2775
  • Abstract
    The basic theory and concepts of an efficient and well-controlled SoC development flow is introduced. This flow is currently being developed and implemented in the Wireless Analog Technology Center, at Texas Instruments (TI). The flow is based on design, test, and characterization data, and synchronizing all three groups to be able to use the same specification compliance matrix (SCM) in a SoC project. The ultimate goal is to make sure that all information from the three groups is being collected in one database as a uniform SCM. This flow is intended to reduce the traditional redundant work and bring consistency across organizations. The SCM software package developed to accomplish this task is described with an example.
  • Keywords
    integrated circuit design; integrated circuit testing; software packages; system-on-chip; IC system development flow; SCM software package; SoC project; Texas Instruments; Wireless Analog Technology Center; design approved specification; design guided test plan; specification compliance matrix; Circuit testing; Databases; Electronic design automation and methodology; Instruments; Integrated circuit testing; Product development; Silicon; System testing; System-on-a-chip; Time to market; IC system design flow; consistently system design; specification compliant matrix (SCM); test plan; time-to-market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
  • Print_ISBN
    0-7803-8834-8
  • Type

    conf

  • DOI
    10.1109/ISCAS.2005.1465202
  • Filename
    1465202