DocumentCode
3545695
Title
An efficient and well-controlled IC system development flow: design approved specification and design guided test plan
Author
Zhou, Tracey ; Tarim, Tuna B.
Author_Institution
Wireless Analog Technol. Center, Texas Instruments, Dallas, TX, USA
fYear
2005
fDate
23-26 May 2005
Firstpage
2775
Abstract
The basic theory and concepts of an efficient and well-controlled SoC development flow is introduced. This flow is currently being developed and implemented in the Wireless Analog Technology Center, at Texas Instruments (TI). The flow is based on design, test, and characterization data, and synchronizing all three groups to be able to use the same specification compliance matrix (SCM) in a SoC project. The ultimate goal is to make sure that all information from the three groups is being collected in one database as a uniform SCM. This flow is intended to reduce the traditional redundant work and bring consistency across organizations. The SCM software package developed to accomplish this task is described with an example.
Keywords
integrated circuit design; integrated circuit testing; software packages; system-on-chip; IC system development flow; SCM software package; SoC project; Texas Instruments; Wireless Analog Technology Center; design approved specification; design guided test plan; specification compliance matrix; Circuit testing; Databases; Electronic design automation and methodology; Instruments; Integrated circuit testing; Product development; Silicon; System testing; System-on-a-chip; Time to market; IC system design flow; consistently system design; specification compliant matrix (SCM); test plan; time-to-market;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN
0-7803-8834-8
Type
conf
DOI
10.1109/ISCAS.2005.1465202
Filename
1465202
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