Test generation for combinational circuits based on DNA computing

Author

Jiejun, Wang ; Chuan-Pei, Xu

Author_Institution

Sch. of Electron. Eng., Guilin Univ. of Electron. Technol., Guilin, China

fYear

2009

fDate

16-19 Aug. 2009

Abstract

The aim of this paper is to illustrate the automatic test generation for combinational circuits based on DNA computing. In the algorithm the chromosomes are encoded by the four bases of nucleic acid Sigma = {A,G,C,T} and the gene-class genetic manipulation is introduced to ensure the population diversity; In addition, the test set size produced by DNA chain is controlled at different stages of test generation so as to reduce the redundancy of test sets and accelerate the speed of test generation. The experimental results for benchmark circuit iscas´85 show that this algorithm can achieve high fault coverage and substantially reduce the size of test vector sets.

Keywords

biocomputing; combinational circuits; genetic algorithms; DNA computing; automatic test generation; chromosomes; combinational circuits; gene-class genetic manipulation; nucleic acid bases; population diversity; test set size; test vector sets; Automatic generation control; Automatic testing; Biological cells; Circuit testing; Combinational circuits; DNA computing; Genetics; Life estimation; Redundancy; Size control; DNA computing; DNA-GA; Fault simulation; Test generation;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on

Conference_Location

Beijing

Print_ISBN

978-1-4244-3863-1

Electronic_ISBN

978-1-4244-3864-8

Type

conf

DOI

10.1109/ICEMI.2009.5274671

Filename

5274671