• DocumentCode
    3545848
  • Title

    PIC simulations of power flow in the Ursa minor linear transformer driver for radiographic applications

  • Author

    Pointon, T.D. ; Leckbee, Joshua J. ; Oliver, Bryan V.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. The linear transformer driver (LTD) is a promising technology for building a compact, high-voltage driver for radiographic applications. The 21 cavity Ursa Minor LTD at Sandia National Laboratories is designed to deliver an output voltage of 2.5 MV. This system provides the first opportunity to evaluate the effects of substantial electron flow in a many-cavity driver at the low end of the voltage range needed for radiography. Each cavity has ten bricks (two capacitors and a single switch). Improving the accuracy and reliability of trigger timing for the 210 switches is a major focus of the research effort on this system.Two PIC simulation models of this driver are being developed with the Quicksilver code at Sandia. A 2-D, azimuthally symmetric, r-z model can efficiently simulate the entire system, including the diode. Each of the 21 cavities is driven with its own external RLC circuit that can be independently triggered. The most recent work with this model has been addressing issues in the diode. In addition, a new, full-360° 3-D model is being used to address the effects of azimuthal asymmetry in the MITL. Currently, the first 14 cavities are modeled with an equivalent single coaxial feed, and each of the last seven cavities is driven by ten independently triggered RLC circuits, uniformly distributed in azimuth. Electrons are emitted from the central cathode with a conventional space-charge-limited emission model.
  • Keywords
    RLC circuits; cathodes; driver circuits; power transformers; pulsed power supplies; radiography; PIC simulation; Ursa Minor LTD; Ursa minor linear transformer driver; cavity models; electron flow; high-voltage driver; power flow; radiographic application; switch reliability; voltage 2.5 MV; Cavity resonators; Integrated circuit modeling; Laboratories; RLC circuits; Radiography; Switches; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science (ICOPS), 2013 Abstracts IEEE International Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2013.6633383
  • Filename
    6633383