• DocumentCode
    3545853
  • Title

    Polarization-dependent saturation in semiconductor vertical-cavity lasers

  • Author

    Van Exter, M.P. ; Al-Remawi, A. ; Woerdman, J.P.

  • Author_Institution
    Huygens Lab., Leiden Univ., Netherlands
  • fYear
    1998
  • fDate
    3-8 May 1998
  • Firstpage
    445
  • Lastpage
    446
  • Abstract
    Summary form only given. The nominal cylindrical symmetry of most vertical-cavity surface-emitting lasers (VCSELs) makes their optical polarization both interesting and fragile. As a result, the actual polarization state is determined by various optical anisotropies, of which linear birefringence, created by stress/strain and internal electric fields, is generally the dominant one. We have now measured the much weaker nonlinear anisotropies in VCSELs, which originate from the polarization dependence of the saturation. The experiments were performed on standard proton-implanted AlGaAs quantum-well VCSELs operating at a wavelength of 850 nm.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; infrared sources; laser cavity resonators; laser transitions; light polarisation; optical saturation; quantum well lasers; surface emitting lasers; 850 nm; AlGaAs; VCSELs; actual polarization state; internal electric fields; linear birefringence; optical anisotropies; optical polarization; polarization dependence; polarization-dependent saturation; semiconductor vertical-cavity lasers; standard proton-implanted AlGaAs quantum-well VCSELs; stress/strain; vertical-cavity surface-emitting lasers; weaker nonlinear anisotropies; Anisotropic magnetoresistance; Birefringence; Geometrical optics; Nonlinear optics; Optical polarization; Optical saturation; Optical surface waves; Semiconductor lasers; Surface emitting lasers; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    1-55752-339-0
  • Type

    conf

  • DOI
    10.1109/CLEO.1998.676477
  • Filename
    676477