Application of a phase-locked optical divide-by-3 system to precision optical frequency measurements

Author

Bernard, J.E. ; Whitford, B.G. ; Marmet, L. ; Madej, A.A. ; Siemsen, K.J.

Author_Institution

Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, Ont., Canada

fYear

1998

fDate

3-8 May 1998

Firstpage

449

Abstract

Summary form only given. Frequency standards in the visible part of the spectrum are useful in applications such as precision laser spectroscopy and the determination of fundamental constants, and, because of the definition of the SI meter, they are wavelength standards and can be applied to length metrology. We have been developing a new frequency standard based on a transition of a single, trapped Sr/sup +/ (/sup 88/Sr/sup +/ 5/sup 2/S/sub 1/2/ 4/sup 2/D/sub 5/2/) at 445 THz (674 nm) with a natural linewidth of 0.3 Hz. A diode laser locked to an environmentally isolated, ultralow expansion cavity is used for measuring the ion spectrum.

Keywords

constants; frequency standards; laser frequency stability; length measurement; radiation pressure; semiconductor lasers; 674 nm; SI meter; Sr; environmentally isolated ultralow expansion cavity; frequency standard; frequency standards; fundamental constants; ion spectrum; length metrology; natural linewidth; phase-locked optical divide-by-3 system; precision laser spectroscop; precision optical frequency measurements; single trapped Sr/sup +/ ion; wavelength standards; Councils; Diode lasers; Frequency conversion; Frequency measurement; Laser transitions; Measurement standards; Optical frequency conversion; Optical harmonic generation; Optical mixing; Phase measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on

Conference_Location

San Francisco, CA, USA

Print_ISBN

1-55752-339-0

Type

conf

DOI

10.1109/CLEO.1998.676482

Filename

676482