Title :
Application of a phase-locked optical divide-by-3 system to precision optical frequency measurements
Author :
Bernard, J.E. ; Whitford, B.G. ; Marmet, L. ; Madej, A.A. ; Siemsen, K.J.
Author_Institution :
Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, Ont., Canada
Abstract :
Summary form only given. Frequency standards in the visible part of the spectrum are useful in applications such as precision laser spectroscopy and the determination of fundamental constants, and, because of the definition of the SI meter, they are wavelength standards and can be applied to length metrology. We have been developing a new frequency standard based on a transition of a single, trapped Sr/sup +/ (/sup 88/Sr/sup +/ 5/sup 2/S/sub 1/2/ 4/sup 2/D/sub 5/2/) at 445 THz (674 nm) with a natural linewidth of 0.3 Hz. A diode laser locked to an environmentally isolated, ultralow expansion cavity is used for measuring the ion spectrum.
Keywords :
constants; frequency standards; laser frequency stability; length measurement; radiation pressure; semiconductor lasers; 674 nm; SI meter; Sr; environmentally isolated ultralow expansion cavity; frequency standard; frequency standards; fundamental constants; ion spectrum; length metrology; natural linewidth; phase-locked optical divide-by-3 system; precision laser spectroscop; precision optical frequency measurements; single trapped Sr/sup +/ ion; wavelength standards; Councils; Diode lasers; Frequency conversion; Frequency measurement; Laser transitions; Measurement standards; Optical frequency conversion; Optical harmonic generation; Optical mixing; Phase measurement;
Conference_Titel :
Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-339-0
DOI :
10.1109/CLEO.1998.676482
