• DocumentCode
    3546292
  • Title

    Sub-pixel surface fitting algorithm in digital speckle correlation method

  • Author

    Lv, Yong ; Feng, Qibo ; Qi, Liangyu ; Chen, Qingshan

  • Author_Institution
    Sch. of Sci., Beijing Jiaotong Univ., Beijing, China
  • fYear
    2009
  • fDate
    16-19 Aug. 2009
  • Abstract
    Sub-pixel surface fitting technique is a way that fits out a correlation coefficient surface around the point getting by the integer pixel searching and locates the sub-pixel maximum point to get the sub-pixel movement. It is a key way to improve the displacement measurement accuracy in digital speckle correlation method (DSCM), meanwhile, it is more time consuming than other steps. Four sub-pixel surface fitting registration methods- Binary quadratic surface fitting, Gaussian surface fitting, least square fitting of Gaussian surface and Lagrange surface fitting are proposed. Binary quadratic surface fitting is the fastest way; least square fitting of Gaussian surface can improve the accuracy but much more time consumption. The accuracy of biquadratic Lagrange surface fitting is extremely high while the speed is not too slow. All these surface fitting method are more suits for natural speckle than artificial one. These conclusions are proved by the results of the experimental system.
  • Keywords
    displacement measurement; optical correlation; speckle; surface fitting; Gaussian surface fitting; Lagrange surface fitting; binary quadratic surface fitting; correlation coefficient surface; digital speckle correlation method; displacement measurement; integer pixel search; least square fitting; sub-pixel surface fitting algorithm; sub-pixel surface fitting registration method; Adaptive optics; Correlation; Electronic mail; Information science; Instruments; Lagrangian functions; Least squares methods; Speckle; Surface fitting; Surface topography; Digital speckle correlation method (DSCM); Displacement measurement; Sub-pixel registration; Surface fitting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-3863-1
  • Electronic_ISBN
    978-1-4244-3864-8
  • Type

    conf

  • DOI
    10.1109/ICEMI.2009.5274751
  • Filename
    5274751