Title :
A 1.8 V 3.2 μW comparator for use in a CMOS imager column-level single-slope ADC
Author :
Snoeij, M.F. ; Theuwissen, A.J.P. ; Huijsing, J.H.
Author_Institution :
Electron. Instrum. Lab., Delft Univ. of Technol., Netherlands
Abstract :
In this paper, a 1.8 V 3.2 μW comparator is presented. It features a hybrid offset compensation scheme and achieves over 60 dB gain with an input offset below 150 μV. The comparator is designed in a 0.18 μm CMOS process and is specifically designed to be used as the key component of a column-level single-slope ADC of a CMOS imager. This ADC architecture is attractive because of its low noise, but so far this has come at the price of a relatively high power consumption. Using this comparator design, the power consumption of column-level single-slope ADC can be reduced significantly.
Keywords :
CMOS image sensors; analogue-digital conversion; comparators (circuits); power consumption; 0.18 micron; 1.8 V; 3.2 muW; CMOS imager; column-level single-slope ADC; comparator; hybrid offset compensation; power consumption; Bandwidth; CMOS image sensors; CMOS process; CMOS technology; Circuit noise; Energy consumption; High-resolution imaging; Image resolution; Instruments; Noise level;
Conference_Titel :
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN :
0-7803-8834-8
DOI :
10.1109/ISCAS.2005.1466047