XPAD : pixel detector for material sciences

Author

Basolo, S. ; Bérar, J.F. ; Boudet, N. ; Breugnon, P. ; Caillot, B. ; Clemens, J.C. ; Delpierre, P. ; Dinkespiler, B. ; Koudobine, I. ; Meessen, Ch. ; Menouni, M. ; Mouget, Ch ; Pangaud, P. ; Potheau, R. ; Vigeolas, E.

Author_Institution

CPPM-IN2P3, Marseille

Volume

7

fYear

2004

fDate

16-22 Oct. 2004

Firstpage

4388

Lastpage

4391

Abstract

Currently available 2D detectors do not make full use of the high flux and high brilliance of third generation synchrotron sources. XPAD prototype, using active pixels, has been developped to fullfill the needs of materials science scattering experiments. At the time, its prototype is build of 8 modules of 8 chips. The threshold calibration of ap 4times10⁴ pixels is discussed. Applications to powder diffraction or SAXS experiments proof that it allows to record high quality data

Keywords

X-ray detection; nuclear electronics; position sensitive particle detectors; semiconductor counters; SAXS experiments; XPAD photon counting detector; electronic characteristics; materials science scattering experiments; pixel detector; powder diffraction; prototype; third generation synchrotron sources; CMOS technology; Detectors; Diffraction; Electromagnetic scattering; Electrons; Materials science and technology; Optoelectronic and photonic sensors; Particle scattering; Prototypes; Synchrotrons;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2004 IEEE

Conference_Location

Rome

ISSN

1082-3654

Print_ISBN

0-7803-8700-7

Electronic_ISBN

1082-3654

Type

conf

DOI

10.1109/NSSMIC.2004.1466858

Filename

1466858