• DocumentCode
    3548608
  • Title

    X ray diamond 2D array

  • Author

    Ciancaglioni, I. ; Rossi, M.C. ; Mazzeo, G. ; Conte, G.

  • Author_Institution
    Dept. of Electron. Eng., Rome Univ.
  • Volume
    7
  • fYear
    2004
  • fDate
    16-22 Oct. 2004
  • Firstpage
    4438
  • Lastpage
    4441
  • Abstract
    X-ray 2D array detectors based on polycrystalline diamond have been fabricated and tested in the dark and under low energy X-ray beams, as well as under UV laser pulses. Depending on the metallic contacts distance or crossover-area, each pixel exhibit low dark current values down to 2 pA and light to dark current ratio as large as 20 when biased at 50 V. The intensity dependence of X-ray photocurrent, as measured for different thickness of Al absorbers, changes according the square root of the beam intensity, thereby suggesting a good crystalline quality of the used diamond slab. A similar behaviour is found when UV laser pulses of high energy are used for device irradiation. At lower energies, a larger photocurrent change with the beam intensity is found, eventually becoming a linear dependence. Such a result confirms the expected good diamond sample quality and suggests a device use for X-ray beam profiler with a large dynamics. The diamond sample and detector uniformity has been also tested under UV laser pulses. The observed pixel response uniformity further support the possible device application as image sensor
  • Keywords
    X-ray detection; image sensors; photoconductivity; semiconductor counters; 50 V; Al absorbers; UV laser pulses; X-ray 2D array detectors; X-ray beam profiler; X-ray photocurrent; beam intensity; dark current; diamond slab; image sensor; low energy X-ray beams; metallic contacts; pixel response; polycrystalline diamond; Dark current; Laser beams; Optical arrays; Optical pulses; Photoconductivity; Sensor arrays; Testing; X-ray detection; X-ray detectors; X-ray lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2004 IEEE
  • Conference_Location
    Rome
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8700-7
  • Electronic_ISBN
    1082-3654
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2004.1466869
  • Filename
    1466869