• DocumentCode
    355010
  • Title

    3-D low-coherence imaging for multiple-layer industrial surface analysis

  • Author

    Seeger, M. ; Podoleanu, Adrian ; Solomon, C.J. ; Jackson, D.A.

  • Author_Institution
    Phys. Lab., Kent Univ., Canterbury, UK
  • fYear
    1996
  • fDate
    2-7 June 1996
  • Firstpage
    328
  • Abstract
    Summary form only given. In conclusion, this system may provide useful information about reflecting interface layers inside transparent objects, at micron scale over a virtually unlimited range. In spite of the 8-bit intensity resolution and 56-dB dynamic range of the CCD camera, which theoretically limit the number of detectable air-glass interfaces to about 80, good images have been obtained in both cases. This method could be especially beneficial for applications where the object features are difficult to access by direct physical measurement such as in assessing the surface roughness of a paint layer under a clear lacquer coating.
  • Keywords
    CCD image sensors; image resolution; industries; light coherence; light interferometry; optical films; surface topography measurement; transparency; 8-bit intensity resolution; CCD camera; clear lacquer coating; detectable air-glass interfaces; direct physical measurement; dynamic range; good images; light interferometry; low-coherence imaging; micron scale; multiple-layer industrial surface analysis; object features; paint layer; reflecting interface layers; surface roughness measurement; transparent objects; Charge coupled devices; Charge-coupled image sensors; Coatings; Dynamic range; Image analysis; Image resolution; Lacquers; Paints; Rough surfaces; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
  • Conference_Location
    Anaheim, CA, USA
  • Print_ISBN
    1-55752-443-2
  • Type

    conf

  • Filename
    864746