Title :
The isolation island and the displacement of decoupling capacitors for power integrity issues
Author :
Lin, Ding-Bing ; Wu, Chun-Te ; Hung, Guo-Chiang
Author_Institution :
Dept. of Electron. Eng., Nat. Taipei Univ. of Technol., Taiwan
Abstract :
This paper presents a method for power integrity (PI) issue by using the isolation island and decoupling capacitors (de-caps). Deferent form the papers discussed before, the location of voltage regulator module (VRM) is taken into account. Without the de-caps, the fundamental resonant frequency is due to the two-dimensional cavity formed by power plan ground plane and VRM which can deteriorate the whole system. It can be shown that at the lower frequency, delta-I noise can be suppressed by VRM, but at the higher frequency, de-caps should be added to maintain the PI. Isolation island is used to help reducing the number of de-caps. The effects of different stick-ups are also discussed in this paper.
Keywords :
capacitors; printed circuits; voltage regulators; decoupling capacitors; delta-I noise; power integrity issues; resonant frequency; two-dimensional cavity; voltage regulator module; Bridge circuits; Circuit noise; Dielectric substrates; Isolation technology; Power capacitors; Power engineering and energy; Regulators; Resonant frequency; Testing; Voltage fluctuations;
Conference_Titel :
Wireless Communications and Applied Computational Electromagnetics, 2005. IEEE/ACES International Conference on
Print_ISBN :
0-7803-9068-7
DOI :
10.1109/WCACEM.2005.1469765