• DocumentCode
    3552220
  • Title

    Minority carrier lifetime control in the gate-controlled switch

  • Author

    Windecker, Roland T. ; Hahn, Larry A. ; Harding, Marvin L.

  • Author_Institution
    Texas Instruments Inc., Dallas, Texas
  • Volume
    10
  • fYear
    1964
  • fDate
    1964
  • Firstpage
    62
  • Lastpage
    62
  • Abstract
    This paper discusses methods of controlling the turn-off gain of the gate-controlled switch. Goldey has shown that the turn-off gain of a gate-controlled switch can be given by β = α1α12-1 where α1and α2represent the current gain across the gated and ungated base layers. If the minority carrier lifetime of the n-base layer is adjusted so that α2is slightly larger than 1 - α1the turn-off gain will be high.
  • Keywords
    Charge carrier lifetime; Conductivity; Doping; Gold; Instruments; Manufacturing; Neutrons; Process control; Switches; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1964 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1964.187475
  • Filename
    1473872