DocumentCode
3552220
Title
Minority carrier lifetime control in the gate-controlled switch
Author
Windecker, Roland T. ; Hahn, Larry A. ; Harding, Marvin L.
Author_Institution
Texas Instruments Inc., Dallas, Texas
Volume
10
fYear
1964
fDate
1964
Firstpage
62
Lastpage
62
Abstract
This paper discusses methods of controlling the turn-off gain of the gate-controlled switch. Goldey has shown that the turn-off gain of a gate-controlled switch can be given by β = α1 α1 +α2 -1 where α1 and α2 represent the current gain across the gated and ungated base layers. If the minority carrier lifetime of the n-base layer is adjusted so that α2 is slightly larger than 1 - α1 the turn-off gain will be high.
Keywords
Charge carrier lifetime; Conductivity; Doping; Gold; Instruments; Manufacturing; Neutrons; Process control; Switches; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1964 International
Type
conf
DOI
10.1109/IEDM.1964.187475
Filename
1473872
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