DocumentCode
3552372
Title
Thermal switchback in high ft epitaxial transistors
Author
Steffe, Walter
Volume
11
fYear
1965
fDate
1965
Firstpage
47
Lastpage
48
Abstract
Maximum power dissipation of transistors is limited by a thermal switchback of the VCE resulting often in a complete melting of a small area of the device even under conditions of maximum thermal conduction between collector junction and case. This thermal switchback occurs when an isolated area of the transistor, because of normal random variations of electrical behavior, or of non-uniform electrical conductivity, or of a physical defect, draws higher currents than other regions; this increase in current density will heat the small area; the VBE , having a negative temperature coefficient, will decrease. As a result IB will increase followed by a much larger increase in IC . This rapid heating avalanche will cause the thermal runaway and eventually a burning out of the isolated area.
Keywords
Avalanche breakdown; Current density; Electric breakdown; Germanium alloys; Heating; Integrated circuit modeling; Power semiconductor switches; Surface treatment; Thermal conductivity; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1965 International
Type
conf
DOI
10.1109/IEDM.1965.187596
Filename
1474177
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