• DocumentCode
    3552372
  • Title

    Thermal switchback in high ftepitaxial transistors

  • Author

    Steffe, Walter

  • Volume
    11
  • fYear
    1965
  • fDate
    1965
  • Firstpage
    47
  • Lastpage
    48
  • Abstract
    Maximum power dissipation of transistors is limited by a thermal switchback of the VCEresulting often in a complete melting of a small area of the device even under conditions of maximum thermal conduction between collector junction and case. This thermal switchback occurs when an isolated area of the transistor, because of normal random variations of electrical behavior, or of non-uniform electrical conductivity, or of a physical defect, draws higher currents than other regions; this increase in current density will heat the small area; the VBE, having a negative temperature coefficient, will decrease. As a result IBwill increase followed by a much larger increase in IC. This rapid heating avalanche will cause the thermal runaway and eventually a burning out of the isolated area.
  • Keywords
    Avalanche breakdown; Current density; Electric breakdown; Germanium alloys; Heating; Integrated circuit modeling; Power semiconductor switches; Surface treatment; Thermal conductivity; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1965 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1965.187596
  • Filename
    1474177