• DocumentCode
    3553263
  • Title

    High-power GaAs close-confinement laser diodes

  • Author

    Gill, R.B. ; Gonda, T.

  • Author_Institution
    RCA, Somerville, N.J.
  • Volume
    16
  • fYear
    1970
  • fDate
    1970
  • Firstpage
    122
  • Lastpage
    122
  • Abstract
    The fabrication and characteristics of high-power close-confinement GaAs laser diodes are described. Single-pellet devices emitting up to 100 watts peak power at 300°K and multiple-pellet units emitting up to 250 watts peak power are detailed. All diodes were fabricated from GaAlAs-GaAs, heterostructure wafers that were prepared by liquid phase epitaxy. The parameters considered in the design of these devices are discussed in detail and the test equipment and measurement techniques used in their characterization are outlined. Test results showing lasing threshold current density, peak optical power output, conversion efficiency, and emitted beam patterns for these devices are presented. Reliability data relating to long-term operational life and mechanical and environmental testing is also presented. A comparison is made of the gradual degradation of units operated at a current density of 50,000 A/cm2with units operated at reduced (30,000 A/cm2) drive currents.
  • Keywords
    Diode lasers; Epitaxial growth; Gallium arsenide; Measurement techniques; Optical device fabrication; Optical devices; Stimulated emission; Test equipment; Testing; Threshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1970 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1970.188309
  • Filename
    1476421