DocumentCode
3553710
Title
New technique of doped oxide diffusion and its application to integrated circuit devices
Author
Tanikawa, E. ; Takayama, O. ; Maeda, K.
Author_Institution
Fujitsu Limited, Kawasaki, Japan
Volume
19
fYear
1973
fDate
1973
Firstpage
54
Lastpage
57
Abstract
A new technique of doped oxide diffusion is developed and investigated. In the present method, the doped oxide is deposited in an evacuated system from organic compound sources. We applied this method to every diffusion process in the fabrication of bipolar IC. The reproducibility of the "unsaturated diffusion" is much improved and less defect generation as compared with the conventional methods is confirmed, Its extensive applicability has standardized the diffusion process in which various kinds of techniques have been used.
Keywords
Application specific integrated circuits; Bipolar integrated circuits; Diffusion processes; Fabrication; Impurities; Organic compounds; Oxidation; Reproducibility of results; Silicon; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1973 International
Type
conf
DOI
10.1109/IEDM.1973.188647
Filename
1477524
Link To Document