• DocumentCode
    3553710
  • Title

    New technique of doped oxide diffusion and its application to integrated circuit devices

  • Author

    Tanikawa, E. ; Takayama, O. ; Maeda, K.

  • Author_Institution
    Fujitsu Limited, Kawasaki, Japan
  • Volume
    19
  • fYear
    1973
  • fDate
    1973
  • Firstpage
    54
  • Lastpage
    57
  • Abstract
    A new technique of doped oxide diffusion is developed and investigated. In the present method, the doped oxide is deposited in an evacuated system from organic compound sources. We applied this method to every diffusion process in the fabrication of bipolar IC. The reproducibility of the "unsaturated diffusion" is much improved and less defect generation as compared with the conventional methods is confirmed, Its extensive applicability has standardized the diffusion process in which various kinds of techniques have been used.
  • Keywords
    Application specific integrated circuits; Bipolar integrated circuits; Diffusion processes; Fabrication; Impurities; Organic compounds; Oxidation; Reproducibility of results; Silicon; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1973 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1973.188647
  • Filename
    1477524