• DocumentCode
    3554166
  • Title

    The effect of operating frequency on propagation delay in silicon-on-sapphire digital integrated circuits

  • Author

    Eaton, S. Sheffield ; Lalevic, B.

  • Author_Institution
    RCA, Solid State Division, Somerville NJ
  • Volume
    22
  • fYear
    1976
  • fDate
    1976
  • Firstpage
    192
  • Lastpage
    194
  • Abstract
    The propagation delay between any two nodes in a silicon-on-sapphire MOS digital integrated circuit operating at supply voltages near transistor threshold has been observed to be a function of the operating frequency. This effect is attributed to a transient drain current whose magnitude decreases with increasing frequency of applied gate voltage. Evidence of this relationship is discussed as well as possible explanations for the origin of the transient current.
  • Keywords
    Circuit testing; Counting circuits; Digital circuits; Digital integrated circuits; Frequency; Inverters; Propagation delay; Silicon; Solid state circuits; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1976 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1976.189016
  • Filename
    1478728