DocumentCode
3554166
Title
The effect of operating frequency on propagation delay in silicon-on-sapphire digital integrated circuits
Author
Eaton, S. Sheffield ; Lalevic, B.
Author_Institution
RCA, Solid State Division, Somerville NJ
Volume
22
fYear
1976
fDate
1976
Firstpage
192
Lastpage
194
Abstract
The propagation delay between any two nodes in a silicon-on-sapphire MOS digital integrated circuit operating at supply voltages near transistor threshold has been observed to be a function of the operating frequency. This effect is attributed to a transient drain current whose magnitude decreases with increasing frequency of applied gate voltage. Evidence of this relationship is discussed as well as possible explanations for the origin of the transient current.
Keywords
Circuit testing; Counting circuits; Digital circuits; Digital integrated circuits; Frequency; Inverters; Propagation delay; Silicon; Solid state circuits; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1976 International
Type
conf
DOI
10.1109/IEDM.1976.189016
Filename
1478728
Link To Document