Title :
Modal analysis of sub-/spl mu/m period nm-linewidth semiconductor gratings
Author :
Chu, A.-S. ; Brueck, Steven R. J.
Author_Institution :
Center for High Technol. Mater., New Mexico Univ., Albuquerque, NM, USA
Abstract :
Summary form only given. We have carried out a rigorous electromagnetic analysis of nm-linewidth, sub-/spl mu/m period, rectangular semiconductor gratings based on the modal theory of square-profiled gratings using exact eigensolutions in the grating region. As opposed to the traditional rigorous coupled wave analysis, the modal analysis allows us to analyze the role of each eigenfunction and provides much greater physical insight with comparable computational difficulty. These studies are important for understanding the electromagnetic response of quantum scale semiconductor structures such as gratings.
Keywords :
diffraction gratings; eigenvalues and eigenfunctions; electromagnetic wave diffraction; optical waveguide theory; computational difficulty; diffraction gratings; eigenfunction; electromagnetic response; exact eigensolutions; grating region; modal analysis; nm-linewidth; physical insight; quantum scale semiconductor structures; rectangular semiconductor gratings; rigorous electromagnetic analysis; square-profiled gratings; sub-/spl mu/m period nm-linewidth semiconductor gratings; Dielectrics; Dispersion; Gratings; Magnetic analysis; Magnetic materials; Modal analysis; Reflectivity; Semiconductor materials; Tellurium; Wave functions;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1996. QELS '96., Summaries of Papers Presented at the
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-444-0