DocumentCode
3554238
Title
Electrical and optical properties of tin oxide-gallium arsenide heterojunctions
Author
Baliga, B. Jayant ; Ghandhi, Sorab K. ; Borrego, Jose M.
Author_Institution
General Electric Company, Research and Development Center, Schenectady, N.Y.
Volume
22
fYear
1976
fDate
1976
Firstpage
457
Lastpage
460
Abstract
This paper describes the electrical and optical properties of tin oxide-gallium arsenide heterojunctions. These structures, comprising a highly conducting, wide gap semiconductor in contact with a lightly doped, narrower gap semiconductor substrate, have promise for photovoltaic applications. Epitaxial layers of gallium arsenide were grown by the reaction of trimethylgallium and arsine. These were covered with tin oxide, which was formed by the oxidation of tetramethyltin. All processing is described for eliminating photo-suppression effects in these structures. The photo-response and the electrical characteristics of the cells are also described.
Keywords
Contacts; Electric variables; Epitaxial layers; Gallium arsenide; Heterojunctions; Oxidation; Photovoltaic systems; Solar power generation; Substrates; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1976 International
Type
conf
DOI
10.1109/IEDM.1976.189082
Filename
1478794
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