Title :
Hot electron emission from a semiconductor under low-level avalanche multiplication
Author_Institution :
IBM System Products Division, Essex Junction, Vermont
Keywords :
Electron emission; Electron optics; Energy loss; Insulation; Ionization; Optical scattering; Phonons; Stimulated emission; Substrates; Voltage;
Conference_Titel :
Electron Devices Meeting, 1976 International
DOI :
10.1109/IEDM.1976.189111
